ETHERNET
Digital Testing
Common Devices Under Test
Typical products undergoing Ethernet signal integrity testing include:
- Network Interface Cards (NICs)
- Network Switches and Routers
- Industrial Ethernet Devices
- Communication Base Station Equipment
- Servers and Storage Systems
- Cable Assemblies (e.g., RJ-45, SFP+, QSFP cables)
ETHERNET Test Specifications
Key test specifications include:
- Electrical Characteristics: Such as voltage swing, steady-state levels, input/output impedance, etc.
- Timing Parameters: Including data setup time, hold time, clock skew, etc.
- Signal Integrity: Such as eye diagram quality, jitter, crosstalk, etc.
- Environmental Requirements: Such as the impact of temperature, humidity, and power supply noise on testing.
Common Ethernet Signal Integrity Physical Layer Test Items
The main signal integrity test items include:
- Eye Diagram Test: Examines the signal waveform's opening and noise margin at the receiver.
- Clock and Data Recovery (CDR) Test
- Jitter Analysis: Measures Unit Interval (UI) offset, periodic jitter, random jitter, etc.
- TDR/TDT Test: Evaluates trace impedance matching and reflection characteristics.
- Return Loss and Insertion Loss (S-parameter Test)
- Signal Swing and Rise/Fall Time
- Signal Template Mask Compliance Test
Commonly Used Test Instruments
Commonly used equipment includes:
- High-Bandwidth Real-Time Oscilloscopes (e.g., from Tektronix, Keysight)
- Bit Error Rate Testers (BERT)
- Vector Network Analyzers (VNA)
- Time Domain Reflectometers (TDR) / Transmission Testers (TDT)
- Ethernet Protocol Analyzers
- Dedicated Ethernet Test Platforms (e.g., from Spirent, Ixia)



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