As storage chip speeds continue to upgrade, the Interposer used in physical layer signal characterization has become a core challenge in chip verification. The CLAUDE SIGLINK series Interposer is specifically designed to address this challenge, covering DRAM and NAND FLASH testing requirements.

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As storage chip speeds continue to upgrade, the Interposer used in physical layer signal characterization has become a core challenge in chip verification. The CLAUDE SIGLINK series Interposer is specifically designed to address this challenge, covering DRAM and NAND FLASH testing requirements.

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As storage chip speeds continue to upgrade, the Interposer used in physical layer signal characterization has become a core challenge in chip verification. The CLAUDE SIGLINK series Interposer is specifically designed to address this challenge, covering DRAM and NAND FLASH testing requirements.

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As storage chip speeds continue to upgrade, the Interposer used in physical layer signal characterization has become a core challenge in chip verification. The CLAUDE SIGLINK series Interposer is specifically designed to address this challenge, covering DRAM and NAND FLASH testing requirements.

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In high-speed digital signal testing, reliable and precise connection methods are crucial for ensuring measurement quality. We not only provide comprehensive high-speed digital signal testing services but also independently design and sell a variety of high-performance test fixtures and accessories, specifically optimized to meet the connectivity demands in high-speed signal integrity validation. Our test fixtures cover a wide range of application scenarios, including but not limited to high-speed SerDes interfaces, DDR, PCIe, USB, MIPI, and other standards. The products support high-bandwidth, low-loss transmission, and feature excellent Return Loss and Insertion Loss performance, meeting the stringent requirements of laboratory, R&D, and mass production environments.

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In high-speed digital signal testing, signal integrity is critical. To meet customers' needs for high-frequency and high-precision measurements, we not only provide professional testing services but also simultaneously offer high-performance test accessories and probes, helping engineers accurately reproduce real signals. We have carefully selected and independently developed a range of probe products suitable for various testing scenarios. These include differential probes, single-ended probes, high-end models with bandwidths up to tens of GHz, as well as customized accessories compatible with multiple connection methods. Our products are widely applicable for signal debugging and validation of high-speed interfaces such as SerDes, PCIe, USB, DDR, HDMI, and more.

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